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KMID : 0362820080270010049
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Journal of the Korean Academy of Implant Dentistry
2008 Volume.27 No. 1 p.49 ~ p.53
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Measuring the lateral wall thickness of the maxillary sinus by using dental computed tomography
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Park Dae-JIn
Lee Jang-Yeol
Kim Hyoun-Chull
Park II-Hae
Lee Sang-Chull
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Abstract
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Purpose: The most common complication during sinus graft surgery is perforation of schneiderian membrane, especially occur when forming the lateral window using surgical bur. To prevent perforation we can use a high price device such as the piezoelectric device. But when the lateral wall is thick, the operation takes longer time on the contrary. The purpose of this study was to investigate the lateral wall thickness of the maxillary sinus to prevent perforation of Schneiderian membrane and to choose proper device for forming the lateral window.
Materials and Methods: Using dental computed tomography for sinus graft case in LivingWell Dental Hospital we measured the lateral wall thickness at the level of 3 mm from the sinus floor and 13 mm from the alveolar crest.
Results: The average thickness was 1.6mm ± 0.7 at the level of 2 mm from the sinus floor was and 1.4mm ± 0.7 at the level of 13mm from the alveolar crest. But the measuring value shows large individual difference and their were no corelationship between the thickness of lateral wall and the width of maxillary sinus.
Conclusion: From the results of this study we could offer the average thickness of the lateral wall. But it shows large individual deviation and we could not discover the anatomic indicator related the thickness of lateral wall. Therefore it is reqired to take computed tomography for evaluation of the maxillary sinus wall.
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